Name
Abstract | ||
|---|---|---|
This paper presents a automatic test pattern generation technique to improve the diagnostic resolution of a given test set. Each test pattern generated by existing techniques detects a large number of faults. Identifying the faulty candidate from a large set of possible fault candidates is extremely difficult and time consuming. A novel framework to adoptively generate additional patterns for diagnosing the faulty location is presented. The additional patterns prune a set of fault free candidates from the possible fault candidates. The proposed technique improves the diagnostic resolution where each new pattern detects only a small number of faults and each fault is detected by few patterns. The proposed method is applicable to any fault model and distinguishes a large number of faults with a small number of patterns. For simplicity we demonstrate the effectiveness of the approach on the path delay fault model. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1109/ISQED.2008.79 | San Jose, CA |
Keywords | Field | DocType |
adaptive diagnosis,path delay fault model,automatic test pattern generationtechnique,novel test generation methodology,giventest set,large number,possible fault candidate,distinguishesa large number,additional pattern,fault model,small numberof fault,fault free candidate,failure analysis,fault detection,automatic test pattern generation,diagnosis | Stuck-at fault,Small number,Automatic test pattern generation,Fault coverage,Computer science,Fault detection and isolation,Path delay,Real-time computing,Electronic engineering,Fault model,Test set | Conference |
ISBN | Citations | PageRank |
978-0-7695-3117-5 | 3 | 0.42 |
References | Authors | |
4 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Rajsekhar Adapa | 1 | 35 | 3.92 |
| Edward Flanigan | 2 | 14 | 3.05 |
| Spyros Tragoudas | 3 | 625 | 88.87 |