Name
Papers
Collaborators
SPYROS TRAGOUDAS
172
98
Citations 
PageRank 
Referers 
625
88.87
1014
Referees 
References 
1964
1727
Search Limit
1001000
Title
Citations
PageRank
Year
High-Speed Memristive Ternary Content Addressable Memory00.342022
Resiliency of SNN on Black-Box Adversarial Attacks.00.342021
Test Pattern Generation and Critical Path Selection in the Presence of Statistical Delays00.342020
On the Sensitization Probability of a Critical Path Considering Process Variations and Path Correlations00.342019
Low Power Artificial Neural Network Architecture.00.342019
A Generalized Approach to Implement Efficient CMOS-Based Threshold Logic Functions.20.392018
Efficient Computation Of The Sensitization Probability Of A Critical Path Considering Process Variations And Path Correlation00.342017
Reducing Power, Area, And Delay Of Threshold Logic Gates Considering Non-Integer Weights00.342017
Diagnosis of Performance Limiting Segments in Integrated Circuits Using Path Delay Measurements.10.382017
Efficient Critical Path Selection Under a Probabilistic Delay Model.20.402017
More Efficient Testing of Metal-Oxide Memristor–Based Memory30.402017
Delay Analysis for Current Mode Threshold Logic Gate Designs.20.422017
A new method to identify threshold logic functions.10.372017
Non-enumerative Generation of Path Delay Distributions and Its Application to Critical Path Selection.00.342016
A Highly Robust Double Node Upset Tolerant latch10.372016
Compressive image sensor technique with sparse measurement matrix00.342016
Non-enumerative correlation-aware path selection10.352015
A BIST approach for counterfeit circuit detection based on NBTI degradation10.372015
Diagnosis of segment delay defects with current sensing20.392014
A novel parallel adaptation of an implicit path delay grading method10.362014
Error Correction Encoding for Tightly Coupled On-Chip Buses00.342014
Nanopipelined threshold network synthesis00.342014
Diagnosis of small delay defects arising due to manufacturing imperfections using path delay measurements.30.442013
A method to determine the sensitization probability of a non-robustly testable path10.382013
Enhanced Secure Architecture for Joint Action Test Group Systems141.042013
Low power and high speed current-mode memristor-based TLGs.30.442013
Error detection encoding for multi-threshold capture mechanism00.342013
Accurate calculation of SET propagation probability for hardening40.602012
An Online Failure Detection Method for Data Buses Using Multithreshold Receiving Logic00.342012
Securing sensor networks: A novel approach that combines encoding, uncorrelation and node disjoint transmission10.362012
A scalable threshold logic synthesis method using ZBDDs40.542012
A Probabilistic Approach to Diagnose SETs10.352011
Techniques to Prioritize Paths for Diagnosis00.342010
A data capturing method for buses on chip30.402010
Scalable codeword generation for coupled buses20.402010
On-line detection of random voltage perturbations in buses with multiple-threshold receivers10.352010
Scan Shift Power Reduction By Gating Internal Nodes10.382010
Probabilistic methods for the impact of an SET in combinational logic40.452010
24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA566.082009
Scalable Compact Test Pattern Generation for Path Delay Faults Based on Functions00.342009
On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault Test Generation30.412008
A High-Performance Bus Architecture for Strongly Coupled Interconnects10.342008
Sequential Path Delay Fault Identification Using Encoded Delay Propagation Signatures00.342008
A Fault Tolerance Aware Synthesis Methodology for Threshold Logic Gate Networks80.642008
Implicit Identification of Non-Robustly Unsensitizable Paths using Bounded Delay Model10.362008
Prioritization of Paths for Diagnosis20.392008
A Novel Test Generation Methodology for Adaptive Diagnosis30.422008
Function-Based Test Generation for (Non-Robust) Path Delay Faults Using the Launch-off-Capture Scan Architecture20.392007
Accelerating Diagnosis via Dominance Relations between Sets of Faults160.682007
Function-based ATPG for Path Delay Faults using the Launch-Off-Capture Scan Architecture40.442007
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