Name
Abstract | ||
|---|---|---|
Undesired capacitive crosstalk between signals is expected to be a significant concern in deep submicron circuits. New test techniques are needed for these crosstalk faults since they may cause unacceptable performance degradation. We analyze the impact of crosstalk faults on a circuit's power dissipation. Crosstalk faults can be detected by monitoring the dynamic supply current. The test method is based on a recently developed dynamic Idd test metric, the energy consumption ratio (ECR). ECR-based test has been shown to be effective at tolerating the impact of process variations. In this paper, we apply a ECR-based test method called ECR-VDD test to detect the crosstalk faults. The effectiveness of the method is demonstrated by simulation results. |
Year | Venue | Keywords |
|---|---|---|
2001 | ICCAD | dynamic supply current,new test technique,test method,crosstalk fault,dynamic idd test metric,ecr-vdd test,deep submicron circuit,crosstalk fault detection,undesired capacitive crosstalk,ecr-based test method,ecr-based test,test methods,design of experiments,power dissipation,geometric programming,fault detection,process variation |
Field | DocType | ISBN |
Test method,Dissipation,Computer science,Fault detection and isolation,Electronic engineering,Real-time computing,Capacitive sensing,Geometric programming,Electronic circuit,Energy consumption,Design of experiments | Conference | 0-7803-7249-2 |
Citations | PageRank | References |
0 | 0.34 | 9 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Xiaoyun Sun | 1 | 14 | 2.13 |
| Seonki Kim | 2 | 9 | 1.95 |
| Bapiraju Vinnakota | 3 | 237 | 25.36 |