| Combining dictionary coding and LFSR reseeding for test data compression | 14 | 0.78 | 2004 |
| Test vector generation based on correlation model for ratio-IDDQ | 0 | 0.34 | 2003 |
| Development of Energy Consumption Ratio Test | 0 | 0.34 | 2003 |
| Statistical threshold formulation for dynamic Idd test | 9 | 0.56 | 2002 |
| Defect-oriented test scheduling | 40 | 2.91 | 2001 |
| Non-ideal amplifier effects on the accuracy of analog-to-digital capacitor ratio converter | 1 | 0.63 | 2001 |
| Crosstalk fault detection by dynamic Idd | 0 | 0.34 | 2001 |
| Current measurement for dynamic Idd test | 0 | 0.34 | 2001 |
| An analysis of the delay defect detection capability of the ECR test method | 9 | 0.60 | 2000 |
| Fast test application technique without fast scan clocks | 1 | 0.36 | 2000 |
| IC test using the energy consumption ratio | 13 | 0.74 | 2000 |
| Statistical Threshold Formulation For Dynamic I-Dd Test | 10 | 0.68 | 1999 |
| Digital Aetection of Analog Parametric Faults in SC Filters. | 0 | 0.34 | 1999 |
| Deep submicron defect detection with the energy consumption ratio | 4 | 0.44 | 1999 |
| Defect-Oriented Test Scheduling | 0 | 0.34 | 1999 |
| Fast state verification | 4 | 0.48 | 1998 |
| Process-tolerant test with energy consumption ratio | 27 | 1.84 | 1998 |
| Fast fault translation | 2 | 0.44 | 1998 |
| Workload Distribution in Fault Simulation | 7 | 0.80 | 1997 |
| Mixed-Signal Design for Test | 0 | 0.34 | 1996 |
| Zamlog: a parallel algorithm for fault simulation based on Zambezi | 3 | 0.57 | 1996 |
| System-level design for test of fully differential analog circuits | 4 | 0.51 | 1996 |
| Monitoring Power Dissipation for Fault Detection | 23 | 1.93 | 1996 |
| Data parallel-fault simulation | 8 | 0.84 | 1995 |
| System-level design for test of fully differential analog circuits | 6 | 0.96 | 1995 |
| Implementing Multiplication with Split Read-Only Memory | 5 | 0.78 | 1995 |
| Functional test generation for FSMs by fault extraction | 1 | 0.36 | 1994 |
| The design of analog self-checking circuits | 15 | 1.59 | 1994 |
| Analog circuit observer blocks | 13 | 1.93 | 1994 |
| Enumeration of binary trees | 5 | 0.49 | 1994 |
| A C-testable carry-free divider | 4 | 0.77 | 1993 |
| Repair of RAMs with clustered faults | 5 | 0.50 | 1992 |
| MACHETE: synthesis of sequential machines for easy testability | 4 | 0.54 | 1991 |
