Name
Abstract | ||
|---|---|---|
A new ATPG algorithm has been proposed that reduces average heat dissipation (between successive test vectors) during test application. The objective is to permit safe and inexpensive testing of low power circuits and bare dies that would otherwise require expensive heat removal equipment for testing at high speeds. Three new functions, namely transition controllability, observability and test generation costs, have been defined. It has been shown that the transition test generation cost is the minimum number of transitions required to test the corresponding stuck-at fault in fanout free circuits. This cost function is used for target fault selection while the other two functions are used to guide the backtrace and objective selection procedures of PODEM. The tests generated by the proposed ATPG decrease heat dissipation during test application by a factor of 2-23 for benchmark circuits |
Year | DOI | Venue |
|---|---|---|
1994 | 10.1109/TEST.1994.527956 | IEEE Transactions on Computers |
Keywords | DocType | Volume |
observability,controllability,cmos integrated circuits,integrated circuit testing,benchmark circuits,backtrace,integrated circuit manufacture,test generation costs,cooling,atpg,heat dissipation minimization,transition controllability,target fault selection,new automatic test pattern,successive test vector,cost optimal control,minimum number,transition test generation cost,proposed atpg,average number,heat sinks,proposed algorithm,fanout free circuits,heat dissipation,corresponding stuck-at fault,expensive heat removal equipment,test application,low power circuits,economics,minimisation,inexpensive testing,stuck-at fault,average heat dissipation,cost function,test generation cost,electronic engineering computing,bare dies,proposed atpg decrease heat,logic testing,stuck at fault,power dissipation,cmos technology,automatic test pattern generation,design for testability | Conference | 47 |
Issue | ISSN | ISBN |
2 | 1089-3539 | 0-7803-2103-0 |
Citations | PageRank | References |
119 | 11.39 | 19 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Seongmoon Wang | 1 | 605 | 48.50 |
| Sandeep K. Gupta | 2 | 1980 | 229.01 |