Name
Title | ||
|---|---|---|
pTest: An adaptive testing tool for concurrent software on embedded multicore processors |
Abstract | ||
|---|---|---|
More and more processor manufacturers have launched embedded multicore processors for consumer electronics products because such processors provide high performance and low power consumption to meet the requirements of mobile computing and multimedia applications. To effectively utilize computing power of multicore processors, software designers interest in using concurrent processing for such architecture. The master-slave model is one of the popular programming models for concurrent processing. Even if it is a simple model, the potential concurrency faults and unreliable slave systems still lead to anomalies of entire system. In this paper, we present an adaptive testing tool called pTest to stress test a slave system and to detect the synchronization anomalies of concurrent software in the master-slave systems on embedded multicore processors. We use a probabilistic finite-state automaton(PFA) to model the test patterns for stress testing and shows how a PFA can be applied to pTest in practice. |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1109/DATE.2009.5090812 | DATE |
Keywords | Field | DocType |
launched embedded multicore processors,stress testing,low power consumption,popular programming models,power consumption,adaptive testing tool,simple model,master equation,embedded multicore processor,master-slave model,slave system,multicore processor,probabilistic automata,concurrent processing,probabilistic finite-state automaton,program processors,software designers,popular programming model,concurrent software,synchronization anomalies,embedded multicore processors,embedded systems,potential concurrency faults,mobile computing,multicore processors,electronic engineering computing,synchronisation,entire system,utility computing,embedded software,programming model,hardware description language,mobile computer,finite state automaton,software testing,stress,system testing,multicore processing,testing,vhdl,process control,master slave,simulation,adaptive testing,concurrent computing,software design | Computer science,Concurrency,Real-time computing,Software,Multi-core processor,Hardware description language,Computer architecture,Embedded software,Programming paradigm,System testing,Parallel computing,Concurrent computing,Embedded system | Conference |
ISSN | ISBN | Citations |
1530-1591 | 978-1-4244-3781-8 | 1 |
PageRank | References | Authors |
0.40 | 9 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Shou-Wei Chang | 1 | 13 | 1.38 |
| Kun-Yuan Hsieh | 2 | 35 | 3.84 |
| Jenq Kuen Lee | 3 | 459 | 48.71 |