Paper Info
Title
A Method of Test Generation for Weakly Testable Data Paths Using Test Knowledge Extracted from RTL Description
Abstract
Weak testability[1] is a testability measure for register-transfer level (RTL) data paths. If a data path satisfies weak testability, for each hardware element of the data path, there exist paths from some primary inputs to the element to justify some values on its output and paths from the hardware element to some primary outputs to propagate some values on its output. For a weakly testable data path, a sequential ATPG tool can generate a test sequence with high fault efficiency in short test generation time[1]. In this paper, we introduce a notion called test knowledge, use of which by commercial ATPG tools can further decrease the test generation time and increase the fault efficiency in weakly testable data paths. This test knowledge is information which is relevant to structure of weakly testable data paths, and also easy to find. Use of this test knowledge to facilitate the test generation and increase the testability of data path is established in experimental results.
Year
DOI
Venue
1999
10.1109/ATS.1999.810722
Asian Test Symposium
Keywords
Field
DocType
hardware element,data path,test knowledge,rtl description,weak testability,weakly testable data path,short test generation time,testability measure,weakly testable data,test generation,test generation time,test sequence,sequential analysis,satisfiability,sequential circuits,design for testability,register transfer level,automatic test pattern generation,data mining,very large scale integration,knowledge extraction
Testability,Design for testing,Generation time,Automatic test pattern generation,Sequential logic,Data path,Computer science,Test sequence,Algorithm,Electronic engineering,Very-large-scale integration
Conference
ISBN
Citations 
PageRank 
0-7695-0315-2
0
0.34
References 
Authors
5
3
Name
Order
Citations
PageRank
Satoshi Ohtake113521.62
Michiko Inoue217929.25
Hideo Fujiwara3364.64