Title | ||
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A Pseudo-Boolean Technique for Generating Compact Transition Tests with All-Output-Propagation Properties |
Abstract | ||
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This paper presents a technique for deriving a test set that detects each transition fault at all the reachable outputs from the fault site. It is known that such tests, which are called all-output-propagation (AOP) ones, can enhance the detectability of un-modeled defects. In order to generate compact AOP tests, pseudo-Boolean (0-1 integer programming) model is introduced in this paper. Moreover, a simple and reasonable heuristic way is also introduced to reduce the size of AOP tests efficiently.It is shown that the proposed method can generate compact AOP tests in a reasonable amount of test generation time through some experiments. |
Year | DOI | Venue |
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2010 | 10.1109/DELTA.2010.58 | Ho Chi Minh City |
Keywords | Field | DocType |
compact aop test,pseudo-boolean technique,generating compact transition tests,fault site,reachable output,integer programming,reasonable heuristic,test generation time,all-output-propagation properties,transition fault,reasonable amount,test set,boolean functions,automatic test pattern generation | Boolean function,Automatic test pattern generation,Generation time,Heuristic,Computer science,Algorithm,Integer programming,Test set | Conference |
ISBN | Citations | PageRank |
978-1-4244-6026-7 | 0 | 0.34 |
References | Authors | |
3 | 2 |
Name | Order | Citations | PageRank |
---|---|---|---|
Tsuyoshi Iwagaki | 1 | 29 | 8.42 |
Mineo Kaneko | 2 | 30 | 17.25 |