Name
Title | ||
|---|---|---|
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection. |
Abstract | ||
|---|---|---|
•A strategy to design BBICS with optimal fault detection sensitivity is proposed.•An asymmetry in the flipping ability of the sensor’s latch is introduced.•Low and high threshold voltage transistors are used to increase sensitivity.•No redesign of the standard cells in CMOS 65-nm is required. |
Year | DOI | Venue |
|---|---|---|
2013 | 10.1016/j.microrel.2013.07.069 | Microelectronics Reliability |
Field | DocType | Volume |
Design strategy,Fault detection and isolation,CMOS,Electronic engineering,Engineering,Transistor,Integrated circuit,Electrical engineering,Built in current sensor,Ionizing particles,Power consumption | Journal | 53 |
Issue | ISSN | Citations |
9 | 0026-2714 | 8 |
PageRank | References | Authors |
0.66 | 2 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jean-Max Dutertre | 1 | 313 | 29.14 |
| Rodrigo Possamai Bastos | 2 | 80 | 13.80 |
| Olivier Potin | 3 | 38 | 3.59 |
| Marie-Lise Flottes | 4 | 366 | 45.31 |
| Bruno Rouzeyre | 5 | 456 | 49.44 |
| Giorgio Di Natale | 6 | 368 | 54.26 |