Name
Affiliation
Papers
RODRIGO POSSAMAI BASTOS
Instituto de Informática, Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, RS, Brazil
32
Collaborators
Citations 
PageRank 
37
80
13.80
Referers 
Referees 
References 
153
480
292
Search Limit
100480
Title
Citations
PageRank
Year
Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault Injection.30.502020
Trojan Detection Test for Clockless Circuits00.342020
A Distributed Body-Biasing Strategy for Asynchronous Circuits00.342019
Non-Intrusive Testing Technique For Detection Of Trojans In Asynchronous Circuits00.342018
Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits.10.362018
A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems.00.342018
Architectures of bulk built-in current sensors for detection of transient faults in integrated circuits.20.392018
Level Shifter Architecture for Dynamically Biasing Ultra-Low Voltage Subcircuits of Integrated Systems10.362018
Assessing body built-in current sensors for detection of multiple transient faults.00.342018
Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation00.342017
Detection of Layout-Level Trojans by Monitoring Substrate with Preexisting Built-in Sensors10.362017
A Practical Framework for Specification, Verification, and Design of Self-Timed Pipelines10.362017
Importance of IR drops on the modeling of laser-induced transient faults00.342017
Method for evaluation of transient-fault detection techniques.10.362017
Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors.10.362017
Comparison of low-voltage scaling in synchronous and asynchronous FD-SOI circuits00.342016
High-level synthesis for event-based systems20.382016
New asynchronous protocols for enhancing area and throughput in bundled-data pipelines.40.432016
Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology10.382015
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS.130.712014
A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic20.402013
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection.80.662013
A bulk built-in sensor for detection of fault attacks.50.542013
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults.30.412013
Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode.40.832012
Robust modular Bulk Built-in Current Sensors for detection of transient faults.90.722012
Evaluating transient-fault effects on traditional C-element's implementations70.602010
Design of a soft-error robust microprocessor00.342009
Comparing Transient-Fault Effects On Synchronous And On Asynchronous Circuits40.432009
Design of a Robust 8-Bit Microprocessor to Soft Errors50.492006
Design at high level of a robust 8-bit microprocessor to soft errors by using only standard gates10.352006
Designing low-power embedded software for mass-produced microprocessor by using a loop table in on-chip memory10.352005