Name
Year | DOI | Venue |
|---|---|---|
1993 | 10.1109/TEST.1993.470693 | ITC |
Keywords | Field | DocType |
enabling technologies,chip,microelectronics,reliability,ics,satisfiability,die,thermal stress,solids,performance,rapid thermal processing,transistors,assembly,performance testing,test methods,testing | Computer science,Rapid thermal processing,Chip,Electronic engineering | Conference |
ISBN | Citations | PageRank |
0-7803-1430-1 | 0 | 0.34 |
References | Authors | |
0 | 1 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| David C. Keezer | 1 | 68 | 17.00 |