Paper Info
Title
Special session: Hot topic design and test of 3D and emerging memories
Abstract
In this hot topic session, we are including three talks that cover design of reliable, emerging memories, with emphasis on 3D memories, DRAM and non-volatile memories. We will also introduce a new class of memory, the Storage Class Memory (SCM), and discuss its reliability issues.
Year
DOI
Venue
2011
10.1109/VTS.2011.5783744
VTS
Keywords
Field
DocType
storage class memory,3d memories,integrated circuit testing,integrated circuit reliability,random-access storage,hot topic design,dram,nonvolatile memories,hot topic session,integrated circuit design,emerging memories,reliable memories,heating
Dram,Computer science,Real-time computing,Integrated circuit design,Storage class memory
Conference
Volume
Issue
ISSN
null
null
1093-0167
ISBN
Citations 
PageRank 
978-1-61284-657-6
0
0.34
References 
Authors
0
1
Name
Order
Citations
PageRank
Wu, Cheng-Wen11843170.44