Abstract | ||
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A new level-line registration technique is proposed for im- age alignment. This approach is robust towards contrast changes, does not require any estimate of the unknown shift between images and tackles some speci¿ cp roblems due to image acquisition systems: ¿xed artefacts apparition or repetitive patterns that could lead to paring ambiguities. The registration by itself is performed by an ef¿cient level- line matching process based on a multi-stage primitive elec- tion procedure. We deal in this paper with a very challeng- ing situation, due to the particular nature of images: Micro Electromechanical Systems (MEMS) pro¿les alignement. |
Year | Venue | Field |
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2002 | ICVGIP | Data mining,Computer vision,Voting,Microelectromechanical systems,Computer science,Artificial intelligence |
DocType | Citations | PageRank |
Conference | 0 | 0.34 |
References | Authors | |
8 | 2 |
Name | Order | Citations | PageRank |
---|---|---|---|
Samia Bouchafa | 1 | 64 | 10.64 |
Bertrand Zavidovique | 2 | 216 | 29.64 |