Name
Title | ||
|---|---|---|
Analysis and mitigation of NBTI-induced performance degradation for power-gated circuits |
Abstract | ||
|---|---|---|
Device aging, which causes significant loss on circuit performance and lifetime, has been a main factor in reliability degradation of nanoscale designs. Aggressive technology scaling trends, such as thinner gate oxide without proportional downscaling of supply voltage, necessitate an aging-aware analysis and optimization flow in the early design stages. Since PMOS sleep transistors in power-gated circuits suffer from static NBTI during active mode and age very rapidly, the aging of power-gated circuits should be explicitly addressed. In this paper, for power-gated circuits, we present a novel methodology for analyzing and mitigating NBTI-induced performance degradation. Aging effects on both logic networks and sleep transistors are jointly considered for accurate analysis. By introducing 25% redundant sleep transistors with reverse body bias applied, the proposed methodology can significantly mitigate the long-term performance degradation and thus extend the circuit lifetime by 3X. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/ISLPED.2011.5993626 | ISLPED |
Keywords | Field | DocType |
aging effects,aging,leakage,logic networks,aging-aware analysis,mitigating nbti-induced performance degradation,nbti-induced performance degradation mitigation,pmos sleep transistors,power-gated circuit,long-term performance degradation,circuit lifetime,accurate analysis,semiconductor device reliability,reverse body bias,novel methodology,nbti,power-gated circuits,reliability degradation,circuit performance,mosfet,proposed methodology,ageing,power gating,integrated circuit,transistors,degradation,logic gate,mathematical model,logic gates | Logic gate,Leakage (electronics),Computer science,Electronic engineering,Real-time computing,Power gating,Gate oxide,MOSFET,Electronic circuit,Transistor,PMOS logic | Conference |
ISSN | ISBN | Citations |
Pending E-ISBN : 978-1-61284-659-0 | 978-1-61284-659-0 | 7 |
PageRank | References | Authors |
0.48 | 17 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kai-Chiang Wu | 1 | 113 | 13.98 |
| Diana Marculescu | 2 | 2725 | 223.87 |
| Ming-Chao Lee | 3 | 48 | 4.66 |
| Shih-Chieh Chang | 4 | 314 | 28.64 |