Title
Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width scaling
Abstract
This paper presents a novel MOS Multi-Finger Turn-on (MFT) solution applying a layout technique, so-called Back-End-Ballast (BEB) poly resistors in compact Merged-Ballast-Circuit (MBC) configurations. The novel approach harnesses the basic principle that multi-finger elements are initially forced into a non-uniform conduction state. From this situation a bias potential can be intrinsically derived to turn on the inactive device parts by using gate- and/or bulk-biasing schemes. Various MFT implementations for area efficient ESD protection and driver design will be extensively discussed. (C) 2003 Elsevier Ltd. All rights reserved.
Year
DOI
Venue
2003
10.1016/S0026-2714(03)00272-5
Microelectronics Reliability
Keywords
Field
DocType
circuit design
Electronic engineering,Engineering,Electronic circuit,Scaling
Journal
Volume
Issue
ISSN
43
9
0026-2714
Citations 
PageRank 
References 
3
2.40
0
Authors
11
Name
Order
Citations
PageRank
S. Trinh132.40
M. Mergens232.40
K. Verhaege3104.13
C. Russ42610.14
J. Armer532.40
P. Jozwiak632.40
B. Keppens7116.43
R. Mohn832.40
G. Taylor932.40
F. De Ranter1032.40
B. Van Camp1132.40