Name
Title | ||
|---|---|---|
Charge storage and data retention characteristics of forming gas-annealed Gd2O3-nanocrystal nonvolatile memory cell. |
Year | Venue | DocType |
|---|---|---|
2012 | Microelectronics Reliability | Journal |
Volume | Issue | Citations |
52 | 8 | 0 |
PageRank | References | Authors |
0.34 | 0 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jer-Chyi Wang | 1 | 1 | 3.07 |
| Chih-Ting Lin | 2 | 36 | 8.91 |
| Chi-Hsien Huang | 3 | 2 | 1.02 |
| Chao-Sung Lai | 4 | 6 | 7.19 |
| Chin-Hsiang Liao | 5 | 0 | 0.34 |