Name
Abstract | ||
|---|---|---|
This paper proposes a method and an on-chip test circuit to measure the center frequency and the bandwidth of RF front-end circuits using the peak amplitudes and the periods of the output signal in response to a realistic step input signal. The method is also suitable for implementation in external test instrumentation. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1109/VTEST.2004.1299247 | VTS |
Keywords | Field | DocType |
on-chip testcircuit,rf front-end circuit,ghz rf front-end bandwidth,realistic step input signal,time domain measurement,external test instrumentation,radiofrequency integrated circuits,rf front end bandwidth time domain measurement,external testinstrumentation,on-chip test circuit,signal amplitude,method isalso,time-domain analysis,rf front end circuits,output signal inresponse,center frequency measurement,center frequency,system testing,frequency domain analysis,chip,front end,bandwidth,radio frequency,time measurement | RF front end,Time domain,Computer science,Electronic engineering,Bandwidth (signal processing),Center frequency,Electronic circuit,Amplitude,Electrical engineering,Instrumentation | Conference |
ISSN | ISBN | Citations |
1093-0167 | 0-7695-2134-7 | 2 |
PageRank | References | Authors |
0.55 | 4 | 3 |