Paper Info
Title
Efficient Test Architecture based on Boundary Scan for Comprehensive System Test
Abstract
As electronic systems are becoming more complex with higher performance and require higher reliability, system test is becoming a very challenging task. Traditionally, functional test has been used to detect various design and manufacturing defects for electronic systems. However, functional test doesn’t work efficiently for large and complex systems specially when debugging and diagnosis of failure conditions is targeted. Boundary scan based test technology is being used for testing circuit boards in the industry for over a decade after being standardized by IEEE. This technology provides an access path to all the pins on all boundary scan-able chips on a circuit board.
Year
DOI
Venue
2005
10.1109/ATS.2005.54
Asian Test Symposium
Keywords
Field
DocType
boundary scan,test technology,electronic system,circuit board,higher performance,complex system,comprehensive system test,efficient test architecture,access path,system test,higher reliability,functional test,boundary scan-able chip,backplanes,control systems,system testing,debugging,functional testing,printed circuits,manufacturing,master slave,process control
Boundary scan,Integration testing,Backplane,Automatic test equipment,System testing,Computer science,Real-time testing,Electronic engineering,White-box testing,Software performance testing,Embedded system
Conference
ISSN
ISBN
Citations 
1081-7735
0-7695-2481-8
0
PageRank 
References 
Authors
0.34
0
1
Name
Order
Citations
PageRank
Tapan J. Chakraborty125826.11