Name
Abstract | ||
|---|---|---|
This paper presents the results of Alpha Single Event Upsets tests of an embedded 8051 microprocessor. Cross sections for the different memory resources (i.e., internal registers, code RAM, and user memory) are reported as well as the error rate for different codes implemented as test benchmarks. Test results are then discussed to find the contribution of each available resource to the overall device error rate. |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1109/IOLTS.2009.5195985 | 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM |
Keywords | Field | DocType |
system testing,system on chip,embedded systems,error rate,system on a chip,codes,cross section,registers,benchmark testing,soft error | System on a chip,Computer science,System testing,Microprocessor,Word error rate,Real-time computing,Computer hardware,Single event upset,Benchmark (computing),Embedded system | Conference |
ISSN | Citations | PageRank |
1942-9398 | 0 | 0.34 |
References | Authors | |
0 | 7 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Paolo Rech | 1 | 155 | 23.92 |
| S. Gerardin | 2 | 31 | 6.60 |
| Alessandro Paccagnella | 3 | 45 | 9.45 |
| Paolo Bernardi | 4 | 244 | 30.63 |
| Michelangelo Grosso | 5 | 34 | 6.16 |
| Matteo Sonza Reorda | 6 | 1250 | 136.66 |
| Davide Appello | 7 | 37 | 8.48 |