Name
Title | ||
|---|---|---|
Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs |
Abstract | ||
|---|---|---|
Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, ... |
Year | DOI | Venue |
|---|---|---|
2007 | 10.1109/VTS.2007.84 | VTS |
Keywords | DocType | ISSN |
un-restored destructive write,available system,multiple input multiple output,increased number,rf path,resistive-open defects,projected data rate,write driver,operational amplifiers,decoding,testing,manufacturing,silicon,sense amplifier,robots,sram | Conference | 1093-0167 |
ISBN | Citations | PageRank |
0-7695-2812-0 | 1 | 0.36 |
References | Authors | |
7 | 6 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| A. Ney | 1 | 1 | 0.36 |
| P. Girard | 2 | 478 | 41.91 |
| C. Landrault | 3 | 52 | 3.07 |
| S. Pravossoudovitch | 4 | 689 | 54.12 |
| A. Virazel | 5 | 169 | 23.25 |
| M. Bastian | 6 | 25 | 3.82 |