Paper Info
Title
Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts
Abstract
This paper reports and analyzes the results of alpha radiation testing campaigns on an embedded microprocessor manufactured with different standard cell libraries, each one enforcing Design for Manufacturing rules at a specific level. A set of analog simulations has been performed on flip-flops built with different physical layouts to reproduce and evaluate the effects of ionizing particles. The results of simulation experiments are presented and discussed, highlighting the configurations which are more likely to improve the system reliability, and then compared with radiation experiments data. Finally, we give a physical interpretation of the observed variations on radiation sensitivity.
Year
DOI
Venue
2010
10.1109/IOLTS.2010.5560236
On-Line Testing Symposium
Keywords
Field
DocType
ionizing particle,different physical layout,root cause,alpha sensitivity variation,analog simulation,radiation sensitivity,different cell layout,physical interpretation,different standard cell library,embedded microprocessor,radiation experiments data,manufacturing rule,alpha radiation testing campaign,integrated circuit layout,optimization,transistors,layout,simulation experiment,embedded systems,design for manufacture,design for manufacturing
Integrated circuit layout,Radiation sensitivity,Computer science,Microprocessor,Electronic engineering,Standard cell,Transistor,Single event upset,Design for manufacturability,Radiation
Conference
ISBN
Citations 
PageRank 
978-1-4244-7724-1
0
0.34
References 
Authors
8
8
Name
Order
Citations
PageRank
P. Rech100.34
M. Grosso210911.39
F. Melchiori300.34
D. Loparco400.34
D. Appello5687.84
L. Dilillo6449.49
A. Paccagnella76110.38
M. Sonza Reorda81099114.76