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D. APPELLO
Author Info
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Name
Affiliation
Papers
D. APPELLO
STMicroelectronics - Agrate Brianza (MI), Italy
11
Collaborators
Citations
PageRank
30
68
7.84
Referers
Referees
References
223
198
100
Search Limit
100
223
Publications (11 rows)
Collaborators (30 rows)
Referers (100 rows)
Referees (100 rows)
Title
Citations
PageRank
Year
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test
3
0.44
2019
Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts
0
0.34
2010
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study
3
0.41
2009
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization
2
0.44
2009
An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs
6
0.61
2008
Embedded Memory Diagnosis: An Industrial Workflow
12
0.79
2006
On the Automation of the Test Flow of Complex SoCs
14
1.52
2006
Understanding Yield Losses in Logic Circuits
12
0.89
2004
Yield analysis of logic circuits
7
1.26
2004
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
2
0.40
2004
A P1500 compliant BIST-based approach to embedded RAM diagnosis
7
0.74
2001
1