Paper Info
Title
ACT: A DFT Tool for Self-Timed Circuits
Abstract
This paper presents a Design for Testability (DFT) toolcalled ACT (Asynchronous Circuit Testing) which uses apartial scan technique to make macro-module based self-timedcircuits testable. The ACT tool is the first of its kindfor testing macro-module based self-timed circuits. ACTmodifies designs automatically to incorporate partial scanand provides a complete path from schematic capture tophysical layout. It also has a test generation system to generatevectors for the testable design and to compute faultcoverage of the generated tests. The test generation systemincludes a module for doing critical hazard free test generationusing a new 6-valued algebra. ACT has been builtaround commercial tools from Viewlogic and Cascade. AViewlogic schematic is used as the design entry point andCascade tools are used for technology mapping.
Year
DOI
Venue
1997
10.1109/TEST.1997.639697
ITC
Keywords
Field
DocType
act tool,design entry point andcascade,test generation system,testable design,aviewlogic schematic,dft tool,test generation,self-timed circuits,kindfor testing macro-module,toolcalled act,free test,self-timedcircuits testable,system testing,design for testability,fault coverage,automatic test equipment,act,business,cascade,modules,asynchronous circuit,fault model,protocols
Design for testing,Fault coverage,System testing,Computer science,Automatic test equipment,Schematic capture,Schematic,Electronic engineering,Real-time computing,Computer engineering,Fault model,Asynchronous circuit
Conference
ISSN
ISBN
Citations 
1089-3539
0-7803-4209-7
0
PageRank 
References 
Authors
0.34
16
2
Name
Order
Citations
PageRank
Ajay Khoche114211.58
Erik Brunvand250966.09