Name
Year | DOI | Venue |
|---|---|---|
1991 | 10.1109/TEST.1991.519776 | ITC |
Keywords | Field | DocType |
high frequency wafer,power supply resonance effects,testing,ceramics,resonance,semiconductor device modeling,predictive models,high frequency,frequency,capacitors | Ceramic,Wafer,Capacitor,Computer science,Semiconductor device modeling,Electronic engineering,Resonance,Switched-mode power supply | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-8186-9156-5 | 0 |
PageRank | References | Authors |
0.34 | 0 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| S. P. Athan | 1 | 10 | 1.44 |
| David C. Keezer | 2 | 68 | 17.00 |
| McKinley, J. | 3 | 0 | 0.34 |