Paper Info
Title
Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing
Abstract
A novel approach to automatic generation of diagnostic memory tests based on fault decomposition and output tracing is described. Fault decomposition allows fault models that precisely describe the fault effects of a specific technology to be considered during test generation; therefore, overtesting of the memory-under-test is avoided. Output tracing of failing memory cells allows for distinguishing of all memory faults of the fault model. An extended greedy-based set-cover algorithm is utilized to generate the march tests that detect all basic fault effects and distinguish among them. The effectiveness of the generated tests is verified using simulation. Test generation time is on the order of a few seconds, while the lengths of the generated tests are only 1N to 3N higher than those of known optimal tests for the same fault models.
Year
DOI
Venue
2004
10.1109/TC.2004.54
IEEE Trans. Computers
Keywords
Field
DocType
automatic generation,basic fault effect,memory fault,output tracing,fault effect,test generation,test generation time,diagnostic memory test,fault decomposition,diagnostic memory,fault model,memory cell,automatic test pattern generation,computational complexity,indexing terms,set cover
Stuck-at fault,Automatic test pattern generation,Generation time,Fault coverage,Computer science,Algorithm,Real-time computing,Fault model,Tracing,Fault indicator,Computational complexity theory
Journal
Volume
Issue
ISSN
53
9
0018-9340
Citations 
PageRank 
References 
8
0.58
17
Authors
2
Name
Order
Citations
PageRank
Dirk Niggemeyer110811.29
Elizabeth M. Rudnick286776.37