Name
Title | ||
|---|---|---|
Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets |
Abstract | ||
|---|---|---|
In previous work, we have shown that optimizing the number ofsite observations leads to more defect detection. However, forincreasingly difficult defects, optimizing patterns for balancedrandom excitation also enhances test effectiveness. We can alsoreduce the effect of undetected defects by choosing tests thatminimize the likelihood of field failures. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1109/VTEST.2004.1299219 | VTS |
Keywords | Field | DocType |
defect detection,undetected defect,test effectiveness,balancedrandom excitation,high quality test sets,optimization criteria,previous work,forincreasingly difficult defect,optimizing pattern,field failure,number ofsite observation,application specific integrated circuits,fault detection,maximum likelihood estimation,optimization,resource management,failure analysis,automatic test pattern generation | Resource management,Automatic test pattern generation,Computer science,Fault detection and isolation,Production testing,Maximum likelihood,Excitation,Test pattern generators,Application-specific integrated circuit,Electronic engineering,Real-time computing,Reliability engineering | Conference |
ISSN | ISBN | Citations |
1093-0167 | 0-7695-2134-7 | 6 |
PageRank | References | Authors |
0.46 | 8 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jennifer Dworak | 1 | 132 | 11.63 |
| David Dorsey | 2 | 8 | 2.57 |
| Amy Wang | 3 | 24 | 5.69 |
| M. Ray Mercer | 4 | 679 | 108.73 |