Built-in Self-Repair in a 3D die stack using programmable logic | 1 | 0.36 | 2013 |
Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis | 2 | 0.37 | 2011 |
A Cost Effective Approach for Online Error Detection Using Invariant Relationships | 16 | 0.84 | 2010 |
Detecting errors using multi-cycle invariance information | 4 | 0.42 | 2009 |
Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets | 6 | 0.46 | 2004 |
A new ATPG algorithm to limit test set size and achieve multiple detections of all faults | 25 | 1.39 | 2002 |
Analysis of delay test effectiveness with a multiple-clock scheme | 6 | 0.78 | 2002 |
Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults | 4 | 0.56 | 2002 |
Defect-Oriented Testing and Defective-Part-Level Prediction | 33 | 2.08 | 2001 |
On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction | 4 | 0.63 | 2000 |
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experiment | 25 | 2.94 | 1999 |
Modeling the Probability of Defect Excitation for a Commercial IC with Implications for Stuck-at Fault-Based ATPG Strategies | 6 | 0.80 | 1999 |