Title
Guest Editorial: ITC 20th Anniversary
Year
Venue
Keywords
1990
IEEE Design & Test of Computers
guest editorial
Field
DocType
Volume
Computer science,Library science,Computer engineering
Journal
7
Issue
Citations 
PageRank 
2
0
0.34
References 
Authors
0
1
Name
Order
Citations
PageRank
M. R. Mercer135347.36