Name
Year | DOI | Venue |
|---|---|---|
1991 | 10.1109/TEST.1991.519744 | ITC |
Keywords | Field | DocType |
gigahertz digital test,real-time data comparison,system testing,real time systems,real time data,frequency,multiplexing,real time,microelectronics,application specific integrated circuits,gallium arsenide | Comparator,System testing,Computer science,Electronic engineering,Application-specific integrated circuit,Multiplexer,Electronics,Electronic circuit,Ultra high frequency,Test data generation | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-8186-9156-5 | 8 |
PageRank | References | Authors |
1.98 | 7 | 1 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| David C. Keezer | 1 | 68 | 17.00 |