Name
Abstract | ||
|---|---|---|
This paper presents a multi-function multi-GHz test module designed to enhance the performance capabilities of automatic test equipment (ATE). The test module is designed with a core logic block consisting of a high-performance FPGA. It also contains an application specific logic block that is designed to perform multiple functions not possible with the FPGA alone. We demonstrate five applications: high-speed signal multiplexing up to 16Gbps, loopback testing, jitter injection, amplitude adjustment, and timing adjustment. The loopback path allows testing up to 9.28Gbps. Digital timing adjustment up to 10ns in 10ps increments, and fine adjustment up to 61ps is shown. Jitter injection up to 81ps (p-p) and amplitude adjustment over a range of 600mV are demonstrated. The core logic block itself has capabilities to generate 10Gbps output signals with 38ps (p-p, BER = 2x10(-5)) jitter. The test module is designed to be compatible with existing ATE infrastructure; connecting to the device under test (DUT) via a device interface board (DIB). A bypass option allows signals from the ATE to pass through to the DUT, permitting use of traditional ATE functions. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/TEST.2011.6139161 | 2011 IEEE INTERNATIONAL TEST CONFERENCE (ITC) |
Keywords | Field | DocType |
multiplexing,testing,logic gate,logic gates,automatic test equipment,field programmable gate array,field programmable gate arrays,jitter,device under test | Loopback,Logic gate,Device under test,Computer science,Automatic test equipment,Field-programmable gate array,Real-time computing,Electronic engineering,Logic block,Jitter,Multiplexing | Conference |
ISSN | Citations | PageRank |
1089-3539 | 1 | 0.38 |
References | Authors | |
0 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| A. M. Majid | 1 | 17 | 3.16 |
| David C. Keezer | 2 | 68 | 17.00 |