Title
Statistical identification and analysis of defect development in digital imagers
Year
DOI
Venue
2009
10.1117/12.806109
Digital photography
Keywords
Field
DocType
sensors,algorithms,digital image,image sensors,radiation
Computer vision,Monte Carlo method,Image sensor,Image quality,CMOS sensor,Demosaicing,Artificial intelligence,Pixel,Bayesian probability,Physics,Bayes' theorem
Conference
Citations 
PageRank 
References 
9
1.42
2
Authors
4
Name
Order
Citations
PageRank
Jenny Leung1336.59
Glenn H. Chapman216734.10
Zahava Koren323936.02
Israel Koren41579175.07