Title
Functional Test Generation For Digital Integrated Circuits Using A Genetic Algorithm
Year
Venue
Keywords
2002
GECCO
digital integrated,genetic algorithm,functional test generation,functional testing
Field
DocType
ISBN
Digital integrated circuits,Computer science,Theoretical computer science,Artificial intelligence,Computer engineering,Machine learning,Genetic algorithm
Conference
1-55860-878-8
Citations 
PageRank 
References 
0
0.34
1
Authors
4
Name
Order
Citations
PageRank
Xiaoming Yu1152.14
Alessandro Fin211110.63
Franco Fummi31001111.62
Elizabeth M. Rudnick486776.37