Title | ||
---|---|---|
Design of Process-Variation-Resilient Analog Basic Components Using Magnetic-Tunnel-Junction Devices. |
Abstract | ||
---|---|---|
Magnetic-tunnel-junction (MTJ) device-based tunable circuitry is proposed for process-variation-resilient VLSI design. By utilizing the attractive features of MTJ device such as non-volatility and 3D stack ability, post-process-oriented tuning mechanism can be implemented with a small area penalty. Additionally, multiple-valued resistance obtained by series-parallel connections of MTJ devices allows more precise tuning of the operating point in the proposed MTJ-based basic component. The use of the proposed mechanism relaxes the constraints on the design margin, which enables to broaden the variety of circuit topologies available for high-performance, low-power and highly reliable VLSI implementation. An experimental design of a new MTJ-based differential comparator with a parameter-tunable capability shows that the use of the proposed multiple-valued resistance achieves 79.6% reduction of the variation effect for the input-output characteristic. Moreover, a design of a tunable operational trans conductance amplifier (OTA) based on the proposed technique and its performance improvement is also demonstrated. |
Year | Venue | Keywords |
---|---|---|
2013 | JOURNAL OF MULTIPLE-VALUED LOGIC AND SOFT COMPUTING | Magnetic tunnel junction device,Circuit conditioning,PVT variation,Post-process variation compensation,Operational conductance amplifier |
Field | DocType | Volume |
Mathematical optimization,Computer science,Electronic engineering,Process variation,Tunnel magnetoresistance,Field-programmable analog array | Journal | 21 |
Issue | ISSN | Citations |
5-6 | 1542-3980 | 2 |
PageRank | References | Authors |
0.43 | 0 | 2 |
Name | Order | Citations | PageRank |
---|---|---|---|
Masanori Natsui | 1 | 80 | 15.10 |
Takahiro Hanyu | 2 | 441 | 78.58 |