Title
A smart sampling scheduling and skipping simulator and its evaluation on real data sets
Abstract
As modern manufacturing technology progresses, measurement tools become scarce resources since more and longer control operations are required. It thus becomes critical to decide whether a lot should be measured or not in order to get as much information as possible on production tools or processes, and to avoid ineffective measurements. To minimize risks and optimize measurement capacity, a smart sampling algorithm has been proposed to efficiently select and schedule production lots on metrology tools. This algorithm and others have been embedded in a simulator called "Smart Sampling Scheduling and Skipping Simulator" (S5). The characteristics of the simulator will be presented. Simulations performed on several sets of instances from three different semiconductor manufacturing facilities (or fabs) will be presented and discussed. The results show that, by using smart sampling, it is possible to drastically improve various factory performance indicators when compared to current fab sampling.
Year
DOI
Venue
2011
10.1109/WSC.2011.6147904
Winter Simulation Conference
Keywords
Field
DocType
smart sampling algorithm,production tool,modern manufacturing technology,current fab sampling,smart sampling,different semiconductor manufacturing facility,ineffective measurement,smart sampling scheduling,measurement tool,optimize measurement capacity,schedule production lot,performance indicator,sampling methods,metrology,semiconductor devices,semiconductor manufacturing,performance index,time measurement,scheduling,job shop scheduling
Performance indicator,Data set,Job shop scheduling,Factory,Scheduling (computing),Simulation,Computer science,Metrology,Semiconductor device fabrication,Sampling (statistics)
Conference
ISSN
ISBN
Citations 
0891-7736
978-1-4799-2077-8
2
PageRank 
References 
Authors
0.47
2
6