Jacques Pinaton - Citegraph

Author Info

Name	Affiliation	Papers
JACQUES PINATON	STMicroelectronics, Rousset, France	34
Collaborators	Citations	PageRank
56	19	12.98
Referers	Referees	References
40	152	78

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100152

Publications (34 rows)

Collaborators (56 rows)

Referers (40 rows)

Referees (100 rows)

Title	Citations	PageRank	Year
A Structure Data-Driven Framework for Virtual Metrology Modeling	1	0.35	2020
A physics-informed Run-to-Run control framework for semiconductor manufacturing.	0	0.34	2020
Evaluation Of Alarm System Performance And Management In Semiconductor Manufacturing	0	0.34	2019
Limiting state space explosion of model checking using discrete event simulation: combining DEVS and PROMELA	0	0.34	2019
Improving Business Process in semiconductor manufacturing by Discovering Business Rules.	0	0.34	2018
Virtual Metrology Modeling based on Gaussian Bayesian Network.	0	0.34	2018
A Study on the Integration of Complex Machines in Complex Job shop Scheduling.	0	0.34	2018
A Bayesian indicator for Run-to-Run performance assessment in semiconductor manufacturing	0	0.34	2018
A Bayesian indicator for Run-to-Run Performance Assessment using Industrail Risk.	0	0.34	2018
A simulation-based approach for an effective AMHS design in a legacy semiconductor manufacturing facility	0	0.34	2017
Translation-Invariant Multiscale Energy-Based PCA for Monitoring Batch Processes in Semiconductor Manufacturing.	3	0.43	2017
Analysis of similarities between alarm events in the semiconductor manufacturing process.	0	0.34	2017
Product quality prediction using alarm data - Application to the semiconductor manufacturing process.	0	0.34	2017
Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing.	0	0.34	2016
Self-tuning of dEWMA controller parameters for mixed product processes with equipment aging	0	0.34	2016
Optimized allocation of defect inspection capacity with a dynamic sampling strategy.	0	0.34	2015
Degradation modelling with operating mode changes	0	0.34	2015
Simulation model to control risk levels on process equipment through metrology in semiconductor manufacturing.	1	0.41	2015
A Pattern-based Approach for Semantic Retrieval of Information Resources in Enterprises - Application Within STMicroelectronics.	0	0.34	2014
Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing	0	0.34	2014
A Semantic Mapping Approach to Retrieve Manufacturing Information Resources: STMicroelectronics' Case Study.	0	0.34	2013
Skipping algorithms for defect inspection using a dynamic control strategy in semiconductor manufacturing.	3	0.61	2013
A semantic support to improve the collaborative control of manufacturing processes in industries.	0	0.34	2013
A survey of semantic web standards to representing knowledge in problem solving situations.	0	0.34	2012
Dispatching of lots to dynamically reduce the wafers at risk in semiconductor manufacturing	1	0.37	2012
A mathematical model for estimating defect inspection capacity with a dynamic control strategy	2	0.46	2012
Validating manufacturing processes using timed sequential machines: application to a semiconductor manufacturing process (WIP)	0	0.34	2012
A Topic-Map-based Framework to Enhance Components' Retrieval in a Process Control.	0	0.34	2012
New methodology for modeling large scale manufacturing process: Using process mining methods and experts' knowledge	1	0.43	2011
Impact of control plan design on tool risk management: a simulation study in semiconductor manufacturing	3	0.87	2011
A smart sampling scheduling and skipping simulator and its evaluation on real data sets	2	0.47	2011
Constructing DEVS models based on experts' knowledge: application to STMicroelectronics' large scale manufacturing processes.	0	0.34	2011
Modeling Large Scale Manufacturing Process From Timed Data Using The Tom4l Approach And Sequence Alignment Information For Modeling Stmicroelectronics' Production Processes	1	0.40	2010
Discovering Large Scale Manufacturing Process Models From Timed Data Application To Stmicroelectronics' Production Processes	1	0.40	2010