Name
Abstract | ||
|---|---|---|
For industry, volume-production-stage testing of multigigahertz ICs poses economic challenges that are at least as significant as the associated technical challenges. Here, the authors address both issues by describing a practical solution based on the retrofit of conventional ATE resources to allow accurate testing of ICs with many channels. Their system can test ICs at 2.5 Gbps over 144 channels, with extensions planned that will have test rates exceeding 5 Gbps. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1109/MDT.2004.37 | IEEE Design & Test of Computers |
Keywords | Field | DocType |
economic challenge,conventional ate resource,multiplexing ate channels,technical challenge,test rate,accurate testing,multigigahertz ics,practical solution,volume-production-stage testing,production testing,signal integrity,calibration,embedded systems,multiplexing,automatic test equipment,electron temperature | Computer science,Automatic test equipment,Signal integrity,Communication channel,Electronic engineering,Electronics,Electronic circuit,Multiplexing,Calibration,Scalability | Journal |
Volume | Issue | ISSN |
21 | 4 | 0740-7475 |
Citations | PageRank | References |
6 | 0.96 | 10 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| David C. Keezer | 1 | 68 | 17.00 |
| Dany Minier | 2 | 28 | 4.32 |
| Marie-Christine Caron | 3 | 6 | 0.96 |