Name
Abstract | ||
|---|---|---|
In the nanometer era, the physical verification of CMOS digital circuit becomes a complex task. Designers must account of numerous new factors that impose a drastic change in validation and physical verification methods. One of these major changes in timing verification to handle process variation lies in the progressive development of statistical static timing engines. However the statistical approach cannot capture accurately the deterministic variations of both the voltage and temperature variations. Therefore, we define a novel method, based on non-linear derating coefficients, to account of these environmental variations. Based on temperature and voltage drop CAD tool reports, this method allows computing the delay of logical paths considering the operating conditions of each cell. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1145/1123008.1123012 | ISPD |
Keywords | Field | DocType |
statistical static timing engine,statistical approach,novel method,physical verification,timing verification,timing analysis,complex task,physical verification method,voltage drop cad tool,supply voltage,cmos digital circuit,temperature variation,operant conditioning,digital circuits,spatial correlation,extraction,process variation | Mathematical optimization,Derating,Digital electronics,Computer science,Simulation,Voltage,Physical verification,Voltage drop,Electronic engineering,CMOS,Static timing analysis,Process variation | Conference |
ISBN | Citations | PageRank |
1-59593-299-2 | 5 | 0.43 |
References | Authors | |
10 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| B. Lasbouygues | 1 | 48 | 4.07 |
| R. Wilson | 2 | 115 | 12.60 |
| N. Azemard | 3 | 104 | 14.17 |
| P. Maurine | 4 | 142 | 14.46 |