Paper Info
Title
The effect of spot defects on the parametric yield of long interconnection lines.
Abstract
The effect of non-catastrophic (or soft) defects (i.e., neither short nor open) on long interconnection lines is analyzed and an estimate is derived for the frequency-dependent critical area for such lines. The analysis is based on a transmission-line model of interconnection lines, and the reflections caused by the defect are taken into account. This analysis results in an estimated prediction of the parametric yield, and a practical recommendation for a better jog insertion in VLSI routing.
Year
DOI
Venue
1995
10.1109/DFTVS.1995.476936
DFT
Keywords
Field
DocType
parametric yield,frequency-dependent critical area,practical recommendation,transmission-line model,analysis result,vlsi routing,interconnection line,jog insertion,estimated prediction,long interconnection line,spot defect,crosstalk,transmission line model,vlsi,computer science,network routing,reflection,transmission line theory,capacitance
Capacitance,Transmission line,Computer science,Network routing,Crosstalk,Electronic engineering,Parametric statistics,Critical area,Interconnection,Very-large-scale integration
Conference
ISBN
Citations 
PageRank 
0-8186-7107-6
6
0.88
References 
Authors
4
2
Name
Order
Citations
PageRank
I. A. Wagner13814.07
I. Koren2284.98