A critical examination of the residual cloud contamination and diurnal sampling effects on MODIS estimates of aerosol over ocean | 15 | 2.56 | 2005 |
Trade-offs between yield and reliability enhancement [VLSI]. | 0 | 0.34 | 1996 |
The effect of spot defects on the parametric yield of long interconnection lines. | 6 | 0.88 | 1995 |
Architecture and technology tradeoffs in the design of next-generation multiprocessor servers. | 2 | 0.40 | 1995 |
Layer assignment for yield enhancement | 5 | 0.80 | 1995 |