Name
Abstract | ||
|---|---|---|
Like other silicon integrated circuit (IC) domains, the smart card market is very competitive and main actors are constantly trying to design the cheapest and safest circuits to ensure their consumers' satisfaction. These specificities lead smart cards ... |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/IOLTS.2006.30 | IOLTS |
Keywords | Field | DocType |
floating gate memory cells,erratic effects,smart card,safest circuit,smart card market,main actor,silicon integrated circuit,error correction,reliability | Computer science,Irradiation,Charge loss,Electronic engineering,Electrical engineering,High energy,Design Error,Ion | Conference |
ISBN | Citations | PageRank |
0-7695-2620-9 | 0 | 0.34 |
References | Authors | |
1 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| G. Cellere | 1 | 4 | 2.42 |
| A. Paccagnella | 2 | 61 | 10.38 |
| A. Visconti | 3 | 3 | 2.06 |
| M. Bonanomi | 4 | 0 | 0.34 |