Author Info
Name
Affiliation
Papers
A. VISCONTI
STMicroelectronics Central R&D
5
Collaborators
Citations 
PageRank 
16
3
2.06
Referers 
Referees 
References 
8
8
2
Title
Citations
PageRank
Year
Cycling-induced threshold-voltage instabilities in nanoscale NAND flash memories: Sensitivity to the array background pattern00.342014
Impact of total dose on heavy-ion upsets in floating gate arrays00.342010
Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions20.422007
Erratic Effects of Irradiation in Floating Gate Memory Cells00.342006
Soft Errors induced by single heavy ions in Floating Gate memory arrays10.632005