Title
Guest Editors' Introduction: Design for Yield and Reliability
Abstract
Presents the guest editorial for this issue of the publication.
Year
DOI
Venue
2004
10.1109/MDT.2004.12
Design & Test of Computers, IEEE
Keywords
Field
DocType
guest editors,voltage,electromagnetic interference,feedback loop,conductors,alpha particles,crosstalk,neutrons
Field reliability,Crosstalk,Computer science,Semiconductor device fabrication,Electromagnetic interference,Design for yield,Feedback loop,Electronic engineering,Chip,Profitability index
Journal
Volume
Issue
ISSN
21
3
0740-7475
Citations 
PageRank 
References 
24
2.11
0
Authors
4
Name
Order
Citations
PageRank
Y. Zorian149947.97
D. Gizopoulos226921.51
Vandenberg, C.3242.11
P. Magarshack4242.45