Name
Abstract | ||
|---|---|---|
A novel scheme for compressing the seeds of a linear feedback shifter register (LFSR) is presented. Instead of storing the seeds of the LFSR in the tester, the scheme compresses the seeds and stores them in the tester. The compression scheme can be used with any variation of static LFSR reseeding. An important feature of the proposed scheme is that the decompressor is test pattern and design independent and can be implemented with very little area overhead. Experimental results show that seed compression can improve overall compression by a factor of 7x for large industrial circuits. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/VLSID.2006.135 | VLSI Design |
Keywords | Field | DocType |
seed compression,overall compression,important feature,pattern independent design independent,novel scheme,seed compression technique,static lfsr reseeding,proposed scheme,large industrial circuit,area overhead,compression scheme,shift registers | Compression (physics),Shift register,Linear feedback shift register,Logic testing,Computer science,Real-time computing,Electronic engineering,Electronic circuit | Conference |
ISSN | ISBN | Citations |
1063-9667 | 0-7695-2502-4 | 7 |
PageRank | References | Authors |
0.54 | 12 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kedarnath J. Balakrishnan | 1 | 160 | 10.85 |
| Seongmoon Wang | 2 | 605 | 48.50 |
| Srimat T. Chakradhar | 3 | 2492 | 185.94 |