Name
Abstract | ||
|---|---|---|
We study recent developments in quantum computing (QC) testing and fault tolerance (FT) techniques and discuss several attempts to formalize quantum logic fault models. We illustrate the inherent need for fault tolerance in QC due to the decoherence problem. Further, we examine several ideas regarding random testing and examine the viability of built-insystem-test (BIST) in future QC circuits. |
Year | DOI | Venue |
|---|---|---|
2007 | 10.1109/HASE.2007.16 | HASE |
Keywords | Field | DocType |
quantum computing fault tolerance,quantum computing,inherent need,random testing,future qc circuit,quantum logic fault model,recent development,decoherence problem,fault tolerance,fault tolerant,fault model,logic circuits,quantum computer,quantum logic | Logic gate,Random testing,Computer science,Logic testing,Quantum logic,Quantum computer,Fault tolerance,Quantum decoherence,Reliability engineering,Built-in self-test | Conference |
ISBN | Citations | PageRank |
0-7695-3043-5 | 2 | 0.49 |
References | Authors | |
8 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| David Y. Feinstein | 1 | 65 | 7.15 |
| V. S. S. Nair | 2 | 101 | 15.55 |
| Mitchell A. Thornton | 3 | 280 | 40.94 |