Name
Abstract | ||
|---|---|---|
Post-silicon validation is used to detect and fix bugs in integrated circuits and systems after manufacture. Due to sheer design complexity, it is nearly impossible to detect and fix all bugs before manufacture. Post-silicon validation is a major challenge for future systems. Today, it is largely viewed as an art with very few systematic solutions. As a result, post-silicon validation is an emerging research topic with several exciting opportunities for major innovations in electronic design automation. In this paper, we provide an overview of the post-silicon validation problem and how it differs from traditional pre-silicon verification and manufacturing testing. We also discuss major post-silicon validation challenges and recent advances. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1145/1837274.1837280 | Design Automation Conference |
Keywords | Field | DocType |
post-silicon validation opportunity,sheer design complexity,recent advance,major post-silicon validation challenge,exciting opportunity,major innovation,future system,electronic design automation,major challenge,post-silicon validation,post-silicon validation problem,integrated circuit,silicon,computer bugs,hardware,manufacturing,integrated circuit design,system testing,testing,crosstalk,post silicon validation | Post-silicon validation,Systems engineering,Computer science,Crosstalk,System testing,Software bug,Manufacturing testing,Electronic engineering,Integrated circuit design,Electronic design automation | Conference |
ISSN | ISBN | Citations |
0738-100X | 978-1-4244-6677-1 | 68 |
PageRank | References | Authors |
2.33 | 43 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Subhasish Mitra | 1 | 3657 | 228.90 |
| Sanjit A. Seshia | 2 | 2226 | 168.09 |
| Nicola Nicolici | 3 | 807 | 59.91 |