Name
Abstract | ||
|---|---|---|
Fault dictionary compaction has been accomplished in the past by removing responses on individual output pins for specific test vectors. In contrast to the previous work, we present techniques for eliminating entire sequences of outputs and for efficiently storing the remaining output sequences. Experimental results on the ISCAS 85 and ISCAS 89 benchmark circuits show that the sizes of dictionaries proposed are substantially smaller than the full fault dictionary, while the dictionaries retain most or all of the diagnostic capability of the full fault dictionary. |
Year | DOI | Venue |
|---|---|---|
1994 | 10.1109/ICCAD.1994.629878 | ICCAD |
Keywords | Field | DocType |
diagnostic capability,fault dictionary compaction,benchmark circuit,present technique,entire sequence,remaining output sequence,full fault dictionary,output sequence removal,individual output pin,previous work,compaction,combinational circuits,benchmark testing,frequency,tires,sequential circuits,dictionaries | Stuck-at fault,Sequential logic,Computer science,Electronic engineering,Combinational logic,Electronic circuit,Compaction,Benchmark (computing) | Conference |
ISSN | ISBN | Citations |
1063-6757 | 0-89791-690-5 | 16 |
PageRank | References | Authors |
1.19 | 4 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Vamsi Boppana | 1 | 267 | 20.98 |
| W. Kent Fuchs | 2 | 1469 | 279.02 |