Name
Abstract | ||
|---|---|---|
Linear Feedback Shift Registers (LFSRs) are commonly used as pseudo-random test pattern generators (TPGs) in BIST schemes. This paper presents a fast simulation-based method to compute an efficient seed (initial state) of a given primitive polynomial ... |
Year | DOI | Venue |
|---|---|---|
1999 | 10.1109/ETW.1999.804523 | ETW '99 Proceedings of the 1999 IEEE European Test Workshop |
Keywords | DocType | ISBN |
primitive polynomial,linear feedback shift registers,pseudo-random test pattern generator,efficient seed,low power circuits,initial state,bist scheme,fast simulation-based method,new bist architecture,cellular automaton,design flow,automatic test pattern generation,vlsi,normal operator,low power electronics,normal modes,lfsr,fault coverage,packaging | Conference | 0-7695-0390-X |
Citations | PageRank | References |
18 | 1.23 | 8 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| F. Corno | 1 | 602 | 55.65 |
| M. Rebaudengo | 2 | 593 | 45.50 |
| M. Sonza Reorda | 3 | 1099 | 114.76 |
| M. Violante | 4 | 19 | 1.69 |