Name
Abstract | ||
|---|---|---|
This paper presents simulations of 3 different implementations of the minority-3 function, with special focus on mismatch analysis through statistical Monte Carlo-simulations. The simulations clearly favors the minority-3 Mirrored gate, and a gate-level ... |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/DFT.2006.31 | DFT |
Keywords | Field | DocType |
micron technologies,statistical monte carlo-simulations,mismatch analysis,special focus,fault tolerant active pixel,different implementation,minority-3 function,minority-3 mirrored gate,cmos image sensor,point defects,active pixel sensor,fault tolerant | Micrometre,Image sensor,Computer science,Real-time computing,Electronic engineering,CMOS sensor,CMOS,Cmos process,Fault tolerance,Pixel,Fabrication | Conference |
ISSN | ISBN | Citations |
1550-5774 | 0-7695-2706-X | 1 |
PageRank | References | Authors |
0.41 | 1 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Michelle L. La Haye | 1 | 3 | 1.60 |
| Cory Jung | 2 | 7 | 2.34 |
| David Chen | 3 | 1 | 0.41 |
| Glenn H. Chapman | 4 | 167 | 34.10 |
| Jozsef Dudas | 5 | 20 | 4.58 |