Name
Abstract | ||
|---|---|---|
In this paper, we suggest that the dynamic power dissipation of acircuit can be used for fault detection. Even those faults which do notaffect static power dissipation can be detected by monitoring dynamic powerdissipation. We discuss how stuck-at, stuck-open, and redundant faults maybe detected by monitoring dynamic power dissipation. In many cases, theFourier spectra of the supply currents in the good and faulty circuits willalso be very different. Further, specific tests can be applied so as toimprove fault coverage. Power monitoring is verified using simulation, andalso experimentally, for example circuits. |
Year | DOI | Venue |
|---|---|---|
1996 | 10.1023/A:1008222623441 | Journal of Electronic Testing: Theory and Applications |
Keywords | DocType | Volume |
I,DDt,test,I,DDQ,test,power dissipation test,spectral analysis | Conference | 11 |
Issue | ISSN | ISBN |
2 | 1093-0167 | 0-8186-7304-4 |
Citations | PageRank | References |
23 | 1.93 | 7 |
Authors | ||
1 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Bapiraju Vinnakota | 1 | 237 | 25.36 |