Name
Title | ||
|---|---|---|
Test Compression For Robust Testable Path Delay Fault Testing Using Interleaving And Statistical Coding |
Abstract | ||
|---|---|---|
This paper proposes a method providing efficient test compression. The proposed method is for robust testable path delay fault testing with scan design facilitating two-pattern testing. In the proposed method, test data are interleaved before test compression using statistical coding. This paper also presents test architecture for two-pattern testing using the proposed method. The proposed method is experimentally evaluated from several viewpoints such as compression rates, test application time and area overhead. For robust testable path delay fault testing on 11 out of 20 ISCAS89 benchmark circuits, the proposed method provides better compression rates than the existing methods such as Huffman coding, run-length coding, Golomb coding, frequency-directed run-length (FDR) coding and variable-length input Huffman coding (VIHC). |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1587/transinf.E92.D.269 | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS |
Keywords | Field | DocType |
test compression, statistical coding, run-length coding, delay fault testing, two-pattern testing, scan testing | Computer science,Golomb coding,Algorithm,Coding (social sciences),Huffman coding,Test data,Data compression,Test compression,Interleaving,Context-adaptive binary arithmetic coding | Journal |
Volume | Issue | ISSN |
E92D | 2 | 1745-1361 |
Citations | PageRank | References |
1 | 0.37 | 11 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kazuteru Namba | 1 | 114 | 27.93 |
| Hideo Ito | 2 | 100 | 17.45 |